FEATURES AFM microscopy for research of parameters

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Uploaded: 09.09.2008
Content: 80909231148080.07.07_.rar (678,1 kB)
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The physics of surface phenomena is currently one of the most rapidly developing fields of science. It is basic research in physics of solid body surface based successes of modern micro- and nanotechnology. Therefore, the study of various electronic, atomic and molecular processes occurring on the surface of solids, is an urgent task

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CONTENTS ........................................................................... ..2
INTRODUCTION ........................................... ............ ... ......... .. ... ... ......... 3
Chapter 1. Modern research methods surface ...... .. ... ... ... ...... 5
1.1. Operating Principles probe microscopes .................. ... ...... ... 5
1.2. Types of probe microscopes .......... ... ... .......... ............ ... ...... 7
1.2.1 Scanning tunneling microscopy .............................. ..7
1.2.2 Scanning atomic force microscopy ........................ .. 8
1.2.3 Near-field Optical Microscopy ........................... .10
1.3. Privacy probe microscopes from external influences. ...... ... 11
Chapter 2. Stages of a scanning probe microscope ....... ... .14
2.1. The first phase of development - nanotechnology ............... .. ............ .14
2.2. Scanning probe microscopy, and the second phase of the development of nanotechnology ............................................................ 15
2.3. Computers and the development of scanning probe microscopy .16
Chapter 3. Methods of atomic force microscopy ...... .. ........................ 18
3.1 Atomic force microscopy (AFM) ................................. 18
3.2 Electric Force Microscopy (EFM) ................................. 23
3.3 Magnetic Force Microscopy (MFM) .............................. 26
Conclusions ................................................................................. 31
References ................................................................................. 32

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